The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Dec. 15, 2008
Method and system for aiding environmental characterization by ultra-wideband radiofrequency signals
Benoît Denis, Grenoble, FR;
Vincenzo LA Tosa, Manfredonia, IT;
Bernard Uguen, Servon sur Vilaine, FR;
Friedman Tchoffo-talom, Saint Renan, FR;
Benoît Denis, Grenoble, FR;
Vincenzo La Tosa, Manfredonia, IT;
Bernard Uguen, Servon sur Vilaine, FR;
Friedman Tchoffo-Talom, Saint Renan, FR;
Commissariat a l'Energie Atomique, Paris, FR;
Abstract
The invention relates to environmental characterization on the basis of an Ultra Wide Band (UWB) radiofrequency communication network. Pulses are emitted and the waveform received is compared with predicted waveforms corresponding to well determined interactions between the wave and its environment. The comparison is done by searching for maximum temporal correlation. The interactions can be notably reflections of the wave on walls or obstacles. The deformations are very dependent on the nature of the materials and directions in which the pulses are emitted and received. If predicted waveforms are stored for various pairs of direction of emission and of reception, it is possible through these correlation operations to find where a wall which gave rise to a reflection is situated.