The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2014

Filed:

Jun. 27, 2008
Applicants:

Anton Theodore Kitai, Ottawa, CA;

Paul Andrew Labelle, Smith Falls, CA;

Robert Glenn Parker, Ottawa, CA;

David R. Walker, Kanata, CA;

Inventors:

Anton Theodore Kitai, Ottawa, CA;

Paul Andrew Labelle, Smith Falls, CA;

Robert Glenn Parker, Ottawa, CA;

David R. Walker, Kanata, CA;

Assignee:

PPI Systems, Inc., Ottawa, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method of probing work pieces is described. A first and second arm each having a pivot point and a guide end are pivotally coupled together at the respective pivot points. A probe tip holder is coupled to at least one of the first arm or the second arm. A guide means guides movement of the guide ends of the pivotally coupled arms, such that movement of the guide end of the first arm and the second arm move the probe tip holder in a plane parallel to the work piece surface.


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