The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Jul. 06, 2011
Allen D. Parks, Spotsylvania, VA (US);
Scott E. Spence, Fredericksburg, VA (US);
Allen D. Parks, Spotsylvania, VA (US);
Scott E. Spence, Fredericksburg, VA (US);
The United States of America as Represented by the Secretary of the Navy, Washington, DC (US);
Abstract
An apparatus is provided for determining a target wavelength λ of a target photon beam. The apparatus includes a photon emitter, a pre-selection polarizer, a prism composed of a Faraday medium, a post-selection polarizer, a detector and an analyzer. The photon emitter projects a monochromatic light beam at the target wavelength λ substantially parallel to a magnetic field having strength B. The target wavelength is offset from established wavelength λ' as λ=λ′+Δλ by wavelength difference of Δλ<<λ. The Faraday prism has Verdet value V. After passing through the pre-selection polarizer, the light beam passes through the prism and is incident to an interface surface at incidence angle θto the normal of the surface and exits into a secondary medium as first and second circularly polarized light beams separated by target separation angle δ and having average refraction angle θ. The secondary medium has an index of refraction of n. After passing the post-selection polarizer, the detector measures target pointer rotation angle Abased on the target separation angle δ. The analyzer determines the target wavelength λ by calculating offset pointer rotation angle ΔA=A−A′from calibrated pointer rotation angle A′based on established separation angle δ′ that corresponds to the established wavelength λ′, and by estimating the wavelength difference based on in which ε is an amplification factor. A method is provided incorporating operations described for the apparatus.