The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Feb. 12, 2007
Applicants:
Joon Won Park, Pohang, KR;
Yu Jin Jung, Pusan, KR;
Bong Jin Hong, Pohang, KR;
Saul Tendler, Nottingham, GB;
Stephanie Allen, Nottingham, GB;
Inventors:
Joon Won Park, Pohang, KR;
Yu Jin Jung, Pusan, KR;
Bong Jin Hong, Pohang, KR;
Saul Tendler, Nottingham, GB;
Stephanie Allen, Nottingham, GB;
Assignees:
POSTECH Foundation, Pohang, KR;
POSCO, Pohang-shi, KR;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12M 1/00 (2006.01); C12M 1/34 (2006.01); C12M 3/00 (2006.01); C12Q 1/68 (2006.01); C07H 21/02 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present patent application describes a cantilever for atomic force microscopy (AFM), which includes a cantilever body having a fixed end and a free end, the free end having a surface region being chemically modified by a dendron in which a plurality of termini of the branched region of the dendron are bound to the surface, and a terminus of the linear region of the dendron is functionalized.