The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2014

Filed:

Oct. 18, 2007
Applicants:

Raymond G. Beausoleil, Redmond, WA (US);

Wei Wu, Mountain View, CA (US);

David A. Fattal, Mountain View, CA (US);

Marco Fiorentino, Mountain View, CA (US);

Inventors:

Raymond G. Beausoleil, Redmond, WA (US);

Wei Wu, Mountain View, CA (US);

David A. Fattal, Mountain View, CA (US);

Marco Fiorentino, Mountain View, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sensing system can include one or more particles having one or more plasmon resonances. The particles can be positioned adjacent to the active region of a sensor to enhance the sensitivity of the sensor to electromagnetic radiation having frequencies corresponding to the plasmon resonances. An array of sensors such as used for color imaging can employ different types of particles adjacent to different sensors, so that different sensors sense different colors. During fabrication of such sensors, the particles can be applied mechanically or using a process such as inkjet printing.


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