The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2014

Filed:

Dec. 03, 2010
Applicants:

Antao Chen, Lake Forest Park, WA (US);

Danling Wang, Seattle, WA (US);

Qifeng Zhang, Seattle, WA (US);

Guozhong Cao, Seattle, WA (US);

Inventors:

Antao Chen, Lake Forest Park, WA (US);

Danling Wang, Seattle, WA (US);

Qifeng Zhang, Seattle, WA (US);

Guozhong Cao, Seattle, WA (US);

Assignee:

The University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides devices, systems, and methods for detecting an analyte vapor. Particularly, electronegative analyte vapors, such as those vapors evolving from explosive compounds, are typical analytes detected the devices. The devices operate using a resistivity change mechanism wherein a nanostructured chemiresistive material undergoes a resistivity change in the presence of an analyte vapor. A resistivity change indicates the presence of an analyte.


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