The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2014

Filed:

Dec. 10, 2010
Applicants:

Roman Gouk, San Jose, CA (US);

Steven Verhaverbeke, San Francisco, CA (US);

Matthew D. Scotney-castle, Morgan Hill, CA (US);

Martin A. Hilkene, Gilroy, CA (US);

Inventors:

Roman Gouk, San Jose, CA (US);

Steven Verhaverbeke, San Francisco, CA (US);

Matthew D. Scotney-Castle, Morgan Hill, CA (US);

Martin A. Hilkene, Gilroy, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B44C 1/22 (2006.01); H01L 21/00 (2006.01); B32B 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for planarizing magnetically susceptible layers of substrates is provided. A patterned resist is formed on the magnetically susceptible layer, and the substrate is subjected to a plasma immersion ion implantation process to change a magnetic property of the magnetically susceptible layer according to the pattern of the resist material. The substrate is subjected to a plasma material removal process either before or after the implantation process to planarize the surface of the magnetically susceptible layer resulting from the implantation process. The plasma material removal process may be directional or non-directional.


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