The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Dec. 23, 2010
Noriji Kawai, Aichi, JP;
Masakazu Endo, Aichi, JP;
Noriji Kawai, Aichi, JP;
Masakazu Endo, Aichi, JP;
Nidek Co., Ltd., Aichi, JP;
Abstract
An object of one aspect of the present invention is to obtain a measurement value in accordance with the condition of a crystalline lens of an examinee's eye. An apparatus for measuring ocular axial length includes: a measuring unit which irradiates measurement waves toward a fundus of the examinee's eye, and calculates the ocular axial length of the examinee's eye based on detection signals obtained from reflected waves including waves reflected from the fundus; and a determining unit which acquires reflection information related to an anterior segment of the examinee's eye, extracts reflection signals corresponding to a reflection object between a cornea and a posterior capsule of a crystalline lens based on the acquired reflection information, and determines whether the examinee's eye is a phakic eye or an IOL eye based on the extracted reflection signals.