The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Mar. 02, 2010
Seung Joo Haam, Seoul, KR;
Yun Mook Lim, Seoul, KR;
Yoon Cheol Lim, Seoul, KR;
Joseph Park, Seoul, KR;
Seung Joo Haam, Seoul, KR;
Yun Mook Lim, Seoul, KR;
Yoon Cheol Lim, Seoul, KR;
JoSeph Park, Seoul, KR;
Industry Academic Cooperation Foundation, Seoul, KR;
Technovalue Co., Ltd., Seoul, KR;
Abstract
The present invention is directed to a device for measuring a deformation ratio of a structure which includes a photonic crystal layer containing nanoparticles aligned at a certain interval. The device is useful for detecting when various industrial structures are deformed by a working load. The presence of deformation and the deformation ratio in the structures may be simply and easily measured by measuring the change of structural color or magnetic flux in the device. The device may be useful to prevent accidents due to excessive deformation in structures.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile