The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2014

Filed:

Nov. 26, 2003
Applicant:

Greg Taillefer, Wrentham, MA (US);

Inventor:

Greg Taillefer, Wrentham, MA (US);

Assignee:

The MathWorks, Inc., Natick, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and systems for monitoring test steps to determine whether the test steps are executable in a test environment are disclosed. The test environment tests various resources, such as programs, data and functions in the electronic devices. The test environment provides a user interface that enables users to edit a sequence of test steps executed in the test environment. The test environment may provide visual representations of the test steps in the sequence of test steps. When the users select a test step in the sequence of test steps, the selected test step is monitored to inform the users whether the selected test step is executable in the test environment. The properties of the selected test step may also be provided and, if the selected test step is not executable in the test environment, users may be informed of the properties that should be specified to make the selected test step executable in the test environment.


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