The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2014
Filed:
Mar. 08, 2011
Masataka Nagura, Yokohama, JP;
Takayuki Nagai, Machida, JP;
Kiminori Sugauchi, Yokohama, JP;
Yutaka Kudo, Kawasaki, JP;
Masataka Nagura, Yokohama, JP;
Takayuki Nagai, Machida, JP;
Kiminori Sugauchi, Yokohama, JP;
Yutaka Kudo, Kawasaki, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The present invention makes it possible to analyze a problem spanning multiple domains. A management apparatus stores an analysis rule. The analysis rule defines a relationship between a causal event, which constitutes a cause of a problem, and multiple relevant events, which denote problems created by the causal event. A first management apparatus acquires a relevant event related to a prescribed node apparatus, which is not under management of the first management apparatus, from a second management apparatus, which manages the prescribed node apparatus. The first management apparatus analyzes a problem by applying the relevant event acquired from the second management apparatus and another relevant event related to a node apparatus under the management of the first management apparatus to the analysis rule.