The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2014

Filed:

Jul. 26, 2006
Applicants:

Richard Taylor, Bristol, GB;

Chris Tofts, Bristol, GB;

Inventors:

Richard Taylor, Bristol, GB;

Chris Tofts, Bristol, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analysis method takes an input model of a real world process with an output parameter, with multiple input parameters. The complexity of regions of the model is determined to locate regions of low complexity, that is to say low sensitivity of the output parameters to the input parameters. The input parameters may be ordered and the results displayed on view of a two dimensional surface starting with the first parameter and ending with the last. The display may represent the value of the output parameter by the length of a bar on the relevant part of the two dimensional surface. A combination of automatic parameter ordering and/or user input may be used to locate suitable regions.


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