The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2014
Filed:
Jun. 10, 2011
Arun Hampapur, Norwalk, CT (US);
Bert Huang, New York, NY (US);
Lexing Xie, Canberra, AU;
Yada Zhu, Yorktown Heights, NY (US);
Arun Hampapur, Norwalk, CT (US);
Bert Huang, New York, NY (US);
Lexing Xie, Canberra, AU;
Yada Zhu, Yorktown Heights, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Principles of the invention provide techniques for analyzing spatiotemporally ambiguous events. In one aspect, an exemplary method includes the steps of storing event data representative of an event, the event data comprising spatiotemporally ambiguous measurements; storing side information, the side information comprising at least one of spatial data and temporal data related to the event in space-time: associating the event data with the side information by soft association to form association data; applying one or more estimation techniques to the association data to form estimation data; and determining at least one of a rate, a factor, a likelihood, a value, a time, a location, and a cause for the event by applying one or more characterization techniques to the estimation data.