The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2014

Filed:

Apr. 17, 2012
Applicants:

Ryuji Funayama, Kanagawa, JP;

Hiromichi Yanagihara, Brussels, BE;

Luc Van Gool, Antwerp, BE;

Tinne Tuytelaars, Wilsele, BE;

Herbert Bay, Zurich, CH;

Inventors:

Ryuji Funayama, Kanagawa, JP;

Hiromichi Yanagihara, Brussels, BE;

Luc Van Gool, Antwerp, BE;

Tinne Tuytelaars, Wilsele, BE;

Herbert Bay, Zurich, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/66 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for operating on images is described for interest point detection and/or description working under different scales and with different rotations, e.g. for scale-invariant and rotation-invariant interest point detection and/or description.


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