The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2014
Filed:
Jul. 11, 2011
Nam Ho Lee, Daejeon, KR;
Yong Chil Seo, Daejeon, KR;
Seung Chan OH, Daejeon, KR;
Seung Wook Lee, Daejeon, KR;
Young Gwan Hwang, Seoul, KR;
Myung Kook Moon, Daejeon, KR;
Soon Yong Park, Daegu, KR;
Nam Ho Lee, Daejeon, KR;
Yong Chil Seo, Daejeon, KR;
Seung Chan Oh, Daejeon, KR;
Seung Wook Lee, Daejeon, KR;
Young Gwan Hwang, Seoul, KR;
Myung Kook Moon, Daejeon, KR;
Soon Yong Park, Daegu, KR;
Korea Atomic Energy Research Institute, Daejeon, KR;
Abstract
A stereo x-ray inspection apparatus and a method for forming a three-dimensional image through volume reconstruction of an image acquired from the same are disclosed. The apparatus includes one x-ray generator and two detectors to acquire two images. The x-ray generator and detectors are arranged in the form of a right-angled triangle, to easily achieve mathematical development and analysis. One of the detectors, which does not just oppose the x-ray generator, is movable and rotatable, to acquire images under the condition that only one detector is moved in accordance with the size of an object, and thus to simplify control operation for the apparatus, so that a more accurate image from an object moving at high speed is acquired.