The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2014
Filed:
Nov. 30, 2009
Stacy K. Kniffen, Richardson, TX (US);
Jordan S. Dean, Sachse, TX (US);
Weldon T. Bailey, Wylie, TX (US);
Michael F. Becker, Austin, TX (US);
Daniel P. Gibbs, Murphy, TX (US);
Stacy K. Kniffen, Richardson, TX (US);
Jordan S. Dean, Sachse, TX (US);
Weldon T. Bailey, Wylie, TX (US);
Michael F. Becker, Austin, TX (US);
Daniel P. Gibbs, Murphy, TX (US);
Innovative Systems Analysis, Inc., Richardson, TX (US);
Abstract
Infrared stationary lens systems for performing multi-dimensional scans of scenes are provided. Systems illustratively include a stationary lens, a first scan mirror, a second scan mirror, and at least one actuator. The stationary lens transmits infrared light and has an optical axis. The first scan mirror has a first axis and pivots about the first axis to direct images of a scene to the stationary lens along a first dimension. The second scan mirror has a second axis and is located in an optical path between the first scan mirror and the stationary lens. The second scan mirror pivots about the second axis to direct images of the scene to the stationary lens along a second dimension. At least one actuator controls the first and the second scan mirrors such that the first and the second scan mirrors step and stare across the multi-dimensional scan of the scene.