The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2014
Filed:
Dec. 20, 2010
George Clement, Bothell, WA (US);
Aman Benes, Seattle, WA (US);
Jason Thorsness, Renton, WA (US);
Robert Greenwell, Fall City, WA (US);
William Gifford Holt, Bothell, WA (US);
George Clement, Bothell, WA (US);
Aman Benes, Seattle, WA (US);
Jason Thorsness, Renton, WA (US);
Robert Greenwell, Fall City, WA (US);
William Gifford Holt, Bothell, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
An assessment results viewer displays the results of assessments that quantify the performance of an aspect of a computing device. The viewer presents both an overview of the collected data and mechanisms for displaying ever-increasing details, including raw data itself. The viewer further provides actionable information to the user that can offer the user guidance, or otherwise suggest potential courses of action. The viewer automatically aggregates multiple iterations of the same assessment to generate derivative overview data, and automatically aligns data collected by the same assessment across multiple job files. Such aggregation and alignment is performed by reference to metadata, including identifying information. Data can be presented in tabular form, and users can pivot along different axis to focus on groupings of data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile