The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2014
Filed:
Sep. 24, 2010
Youn Sung Choi, Plano, TX (US);
Oluwamuyiwa Oluwagbemiga Olubuyide, Plano, TX (US);
Gregory Charles Baldwin, Plano, TX (US);
Youn Sung Choi, Plano, TX (US);
Oluwamuyiwa Oluwagbemiga Olubuyide, Plano, TX (US);
Gregory Charles Baldwin, Plano, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
An apparatus includes a plurality of die areas having integrated circuit (IC) die each having circuit elements for performing a circuit function, and scribe line areas between the die areas. At least one test module is formed in the scribe line areas. The test module includes a reference layout that includes at least one active reference MOS transistor that has a reference spacing value for each of a plurality of context dependent effect parameters, and a plurality of variant layouts. Each variant layout provides at least one active variant MOS transistor that provides a variation with respect to the reference spacing values for at least one of the plurality of context dependent effect parameters.