The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2014

Filed:

Oct. 01, 2010
Applicants:

Vladimir Bashkirov, Loma Linda, CA (US);

Reinhard W. Schulte, Grand Terrace, CA (US);

Inventors:

Vladimir Bashkirov, Loma Linda, CA (US);

Reinhard W. Schulte, Grand Terrace, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 47/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are systems, devices and methodologies relating to an ion induced impact ionization detector and uses thereof. In certain implementations, the detector can include a dielectric layer having one or more wells. An anode layer defining apertures to accommodate the openings of the wells can be disposed on one side of the dielectric layer, and a cathode such as a solid resistive cathode can be disposed on the other side so as to provide an electric field in each of the wells. Various design parameters such as well dimensions and operating parameters such as pressure and high voltage are disclosed. In certain implementations, such an ion detector can be coupled to a low pressure gas volume to detect ionization products such as positive ions. Such a system can be configured to provide single ion counting capability. Various example applications where the ion detector can be implemented are also disclosed.


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