The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8669524 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 11, 2014

Filed:

Oct. 25, 2010
Applicants:

Eric Lifshin, Voorheesville, NY (US);

Michael Stessin, Niskayuna, NY (US);

Isaak Chagouel, Albany, NY (US);

Inventors:

Eric Lifshin, Voorheesville, NY (US);

Michael Stessin, Niskayuna, NY (US);

Isaak Chagouel, Albany, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/225 (2006.01); H01J 37/28 (2006.01); H01J 37/26 (2006.01); H01J 31/28 (2006.01);
U.S. Cl.
CPC ...
G01N 23/225 (2013.01); H01J 37/263 (2013.01); H01J 31/28 (2013.01); H01J 31/226 (2013.01);
Abstract

Method and apparatus are provided for generating an enhanced image of an object. The method includes obtaining images of an area of an object generated using a probe of having a probe size greater than or equal to a minimum probe area size. An enhanced image of the area of the object is generated by accurately computing the emission intensities emitted from pixel areas smaller than the minimum probe size and within the area of the object. This is repeated for other areas of the object to form other enhanced images. The enhanced images are combined to form an accurate enhanced image of the object.


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