The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2014
Filed:
Jun. 12, 2008
Aarne Heinonen, Turku, FI;
Juha Karunen, Littoinen, FI;
Jarmo Korpi, Nousiainen, FI;
Jarmo Nurmi, Kuusisto, FI;
Markku Ojala, Turku, FI;
Timo Salminen, Turku, FI;
Paul White, New South Wales, AU;
Aarne Heinonen, Turku, FI;
Juha Karunen, Littoinen, FI;
Jarmo Korpi, Nousiainen, FI;
Jarmo Nurmi, Kuusisto, FI;
Markku Ojala, Turku, FI;
Timo Salminen, Turku, FI;
Paul White, New South Wales, AU;
Wallac Oy, Turku, FI;
Abstract
Instrumentation and a method for efficient and reliable assaying and measuring samples. The teachings include an automated self-contained instrument, wherein the samples are located on wells of sample plates, and the instrument includes a plurality of units for processing or storing sample plates. The instrument may includes at least one dispensing unit for dispensing reagents or other assay components to the sample wells, at least two units for simultaneously processing or storing a plurality of sample plates, at least one unit for removing substance from the sample wells, and one or several measurement units for optically measuring samples in at least two measurement modes. Further, the instrument includes a manipulator for moving the sample plates in three orthogonal directions or combinations thereof and for rotating the sample plates in relation to a vertical axis for transferring the sample plates to the units.