The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2014
Filed:
Dec. 04, 2012
Cabot Corporation, Boston, MA (US);
Karel Vanheusden, Los Altos, CA (US);
Klaus Kunze, Carlsbad, CA (US);
Hyungrak Kim, Saratoga, CA (US);
Aaron D. Stump, Albuquerque, NM (US);
Allen B. Schult, Albuquerque, NM (US);
Mark J. Hampden-Smith, Albuquerque, NM (US);
Chuck Edwards, Rio Rancho, NM (US);
Anthony R. James, Rio Rancho, NM (US);
James Caruso, Albuquerque, NM (US);
Toivo T. Kodas, Carlisle, MA (US);
Scott Thomas Haubrich, Albuquerque, NM (US);
Mark H. Kowalski, Albuquerque, NM (US);
Cabot Corporation, Boston, MA (US);
Abstract
A composition for the fabrication of reflective features using a direct-write tool is disclosed. The composition comprises metal nanoparticles having an average particle size less than 300 nm and which carry thereon a polymer for substantially preventing agglomeration of the nanoparticles, wherein the nanoparticles exhibit a metal-polymer weight ratio of 100:1 to 10:1. The composition further includes a vehicle for forming a dispersion with the metal nanoparticles. A number of electronic devices comprising a reflective layer formed from the composition are also disclosed. One example case provides an electronic device having a reflective electrode. The reflective electrode comprises a percolation network of the metal nanoparticles embedded in a matrix of the polymer and having an average particle size of less than 300 nm, wherein the reflective electrode is reflective in the visible light range and does not diffract incident light.