The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

Apr. 29, 2011
Applicants:

Dilson Rassier, Montreal, CA;

Aleksander Labuda, Montreal, CA;

Inventors:

Dilson Rassier, Montreal, CA;

Aleksander Labuda, Montreal, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01Q 20/02 (2010.01); G01Q 20/00 (2010.01);
U.S. Cl.
CPC ...
G01Q 20/02 (2013.01); G01Q 20/00 (2013.01);
Abstract

Atomic Force Microscopes (AFMs) allow forces within systems under observation to be probed from the piconewton forces of a single covalent bond to the forces exerted by cells in the micronewton range. The pendulum geometry prevents the snap-to-contact problem afflicting soft cantilevers in AFMs which enable attonewton force sensitivity. However, the microscopic length scale studies of cellular/subcellular forces parallel to the imaging plane of an optical microscope requires high sensitivity force measurements at high sampling frequencies despite the difficulties of implementing the pendulum geometry from constraints imposed by the focused incoming/outgoing light interfering with the sample surface. Additionally measurement systems for biological tissue samples in vitro must satisfy complex physical constraints to provide access to the vertical cantilever. Embodiments of the invention address these geometrical restrictions by exploiting optical periscope approaches that further allows multiple probes to be deployed and multiple optical beams within each probe.


Find Patent Forward Citations

Rassier, Dilson. (2014). Method and apparatus for measuring cantilever deflection in constrained spaces (U.S. Patent No. 8667611). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8667611

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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