The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

Apr. 24, 2007
Applicants:

Raj M. Bharadwaj, Maple Grove, MN (US);

Darryl G. Busch, Eden Prairie, MN (US);

Daniel P. Johnson, Fridley, MN (US);

Ranjana Ghosh, Minneapolis, MN (US);

Inventors:

Raj M. Bharadwaj, Maple Grove, MN (US);

Darryl G. Busch, Eden Prairie, MN (US);

Daniel P. Johnson, Fridley, MN (US);

Ranjana Ghosh, Minneapolis, MN (US);

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for optimizing a diagnostic reasoner model, for use in connection with a diagnostic system for testing a system under test of an aircraft, includes the steps of querying for a plurality of primary indicators, further querying for a plurality of supplemental indicators, and updating the diagnostic reasoner model based at least in part on the supplemental indicators. The primary indicators identify one or more potential faults in the system under test. Each supplemental indicator provides information either validating or invalidating a particular primary indicator or association of primary indicators.


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