The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
Sep. 30, 2010
Sangram Alapati, Austin, TX (US);
Jayakumar N Sankarannair, Bangalore, IN;
Varun Mallikarjunan, Bangalore, IN;
Prathiba Kumar, Tamilnadu, IN;
Satish Kumar Sadasivam, Tamilandu, IN;
Sangram Alapati, Austin, TX (US);
Jayakumar N Sankarannair, Bangalore, IN;
Varun Mallikarjunan, Bangalore, IN;
Prathiba Kumar, Tamilnadu, IN;
Satish Kumar Sadasivam, Tamilandu, IN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A post-silicon testing apparatus, method, and computer program product provide for runtime coverage measurement methodology to measure the architectural events in hardware. Measurement of all architectural events discernable from the instructions and architectural state changes are tracked and recorded. A mechanism to ensure capturing of maskable events is also provided. A feedback driven test-generation approach is enabled by the runtime coverage measurement. The runtime coverage measurement system presents a live view of the comprehensive architectural event coverage to the user/tester. The methodology can be implemented on an operating system environment and also as a standalone/bare-metal tool.