The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

Aug. 24, 2009
Applicants:

Tian Bu, Basking Ridge, NJ (US);

Jin Cao, Edison, NY (US);

Aiyou Chen, New Providence, NJ (US);

LI LI, Edison, NJ (US);

Inventors:

Tian Bu, Basking Ridge, NJ (US);

Jin Cao, Edison, NY (US);

Aiyou Chen, New Providence, NJ (US);

Li Li, Edison, NJ (US);

Assignee:

Alcatel Lucent, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus are provided for incrementally tracking quantiles in the presence of multiple record types. A method for performing incremental quantile tracking includes receiving a first data record of a first record type and a second data record of a second record type, and updating a quantile probability for a quantile value, based on the first record type of the first data record and the second record type of the second data record, to obtain a new quantile probability for the quantile value.


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