The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
Feb. 19, 2010
Anton A. Bougaev, La Jolla, CA (US);
Aleksey M. Urmanov, La Jolla, CA (US);
David K. Mcelfresh, San Diego, CA (US);
Kenny C. Gross, San Diego, CA (US);
Anton A. Bougaev, La Jolla, CA (US);
Aleksey M. Urmanov, La Jolla, CA (US);
David K. McElfresh, San Diego, CA (US);
Kenny C. Gross, San Diego, CA (US);
Oracle International Corporation, Redwood City, CA (US);
Abstract
An electronic system includes an accelerometer. A method for excessive mechanical shock feature extraction for overstress event registration and cumulative tracking includes obtaining a sample from the accelerometer. Feature extraction is performed on the sample using empirical mode decomposition (EMD) to produce a plurality of modes. A pattern classifier is utilized for processing the plurality of modes to determine if the sample classifies as a shock event. If the sample classifies as a shock event, a shock event counter is incremented. If the shock event counter reaches a specified count, an indication to a user is generated.