The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
Jul. 21, 2010
Tien-hsiu Tsai, Taoyuan County, TW;
Meei-ling Jan, Toayuan County, TW;
Yu-ching NI, Taoyuan County, TW;
Tien-Hsiu Tsai, Taoyuan County, TW;
Meei-Ling Jan, Toayuan County, TW;
Yu-Ching Ni, Taoyuan County, TW;
Institute of Nuclear Energy Research Atomic Energy Council, Executive Yuan, Taoyuan County, TW;
Abstract
The present invention provides a method for calibrating the crystal-level detection efficiency, which is capable of evaluating the influences caused by the penetration effect of the crystals of a scintillation detector so as to calculate the difference of detection efficiency between crystals correctly and thereby calibrate the difference between crystals appropriately such that the quality of the imaging result is improved accordingly. The method of present invention is simple without modifying the hardware design and consequently the design cost, manpower cost and time cost can be reduced.