The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
Mar. 10, 2011
Tomohito Mizuno, Tokyo, JP;
Koji Shimazawa, Tokyo, JP;
Hiroshi Kiyono, Tokyo, JP;
TDK Corporation, Tokyo, JP;
Abstract
In exemplary embodiments, first and second parameters are obtained for each of different temperatures of the magnetic recording layer. The absolute value of the first parameter for each magnetic grain has a minimum value when the temperature of each magnetic grain reaches a predetermined temperature that increases as the Curie temperature increases, and decreases as the Curie temperature decreases. The second parameter is related to the standard deviation of the coercivity distribution of the magnetic grains divided by the coercivity of the magnetic recording layer. The method calculates a value where the absolute measurement value of the first parameter has a minimum value and the temperature of the magnetic recording layer at which the standard deviation of the coercivity distribution of the magnetic grains divided by the coercivity of the magnetic recording layer has a maximum value.