The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
Aug. 27, 2010
Rebekah M. Keyser, Poughkeepsie, NY (US);
John A. Rudy, Port Chester, NY (US);
Brian J. Wazewski, Poughkeepsie, NY (US);
Rebekah M. Keyser, Poughkeepsie, NY (US);
John A. Rudy, Port Chester, NY (US);
Brian J. Wazewski, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of controlling a quantity of non-process of record (POR) process limiting yield (PLY) inspections in wafer processing includes setting aside planned capacity for non-POR work, upon receipt of a request for non-POR work, estimating a time required for completion of the request and comparing the estimated time against a remainder of the set aside planned capacity, approving the request in an event the comparison indicates that the estimated time is available in the set aside planned capacity and rejecting the request in an event the comparison indicates that the estimated time is not available in the set aside planned capacity.