The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
Oct. 15, 2010
Michiyo Tanii, Tokyo, JP;
Shingo Kawasaki, Tokyo, JP;
Michiyuki Fujiwara, Tokyo, JP;
Takashi Ishizuka, Tokyo, JP;
Michiyo Tanii, Tokyo, JP;
Shingo Kawasaki, Tokyo, JP;
Michiyuki Fujiwara, Tokyo, JP;
Takashi Ishizuka, Tokyo, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
To provide a highly reliable inspection device that prevents a loss in reliability of inspection that uses information from a position detector as a result of the influence of magnetic bodies or the like that are present in the environment, the inspection device includes biological information measurement units that measure biological information of an inspected target and form an image containing the biological information, a magnetic position detector that detects the position of at least one of the biological information measurement units and the inspection target, and a control unit that controls the biological information measurement units and the magnetic position detector; and further includes the control unit being provided with an environmental magnetic field measurement unit that uses the output of the magnetic position detector to measure distortion of the magnetic field in the measured space in which the biological information measurement units are placed.