The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
Oct. 24, 2011
Feng Tang, Mountain View, CA (US);
Daniel R. Tretter, San Jose, CA (US);
Feng Tang, Mountain View, CA (US);
Daniel R. Tretter, San Jose, CA (US);
Hewlett-Packard Development Company, L.P., Houston, TX (US);
Abstract
Methods, devices, and systems for determining feature descriptors are provided. An example includes defining a plurality of anchor points within a patch of pixels in a particular area that includes a detected feature in an image, defining a first set of subpatches and calculating an intensity of each of the first set of subpatches, defining a second set of subpatches and calculating an intensity of each of the second set of subpatches, comparing the intensity of each of the second set of subpatches to the intensity of each of the first set of subpatches and if the intensity of a second set subpatch is higher than the intensity of a first set subpatch assign a binary value, otherwise assign an alternative binary value, and concatenating all the assigned binary values into a binary feature descriptor.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile