The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
Dec. 09, 2009
Holger Schmitt, Hamburg, DE;
Peter Forthmann, Sandesneben, DE;
Udo Van Stevendaal, Ahrensburg, DE;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
A method and apparatus are provided to filter x-ray beams generated using a CT apparatus or other x-ray based system with displaced acquisition geometry. A CT apparatus may be used having a source (), a detector () transversely displaced from a center () of a field of view () during acquisition of the projection data, and a filter (). The filter may absorb at least a portion of overlapping radiation emitted by the source at opposing angular positions. The amount of transverse displacement may be determined for a desired field of view configuration and amount of overlapping radiation. The detector may be adjusted to correspond to the amount of determined transverse displacement. The size and location of the filter may be determined based on the amount of overlapping radiation. The filter may be adjusted to correspond to the determined size and location of the filter.