The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
Feb. 20, 2012
Anapathur V. Ramesh, Bothell, WA (US);
Kishor S. Trivedi, Durham, NC (US);
Tilak C. Sharma, Tacoma, WA (US);
Dazhi Wang, San Jose, CA (US);
David William Twigg, Federal Way, WA (US);
Le P. Nguyen, Renton, WA (US);
Yun Liu, Lynwood, WA (US);
Anapathur V. Ramesh, Bothell, WA (US);
Kishor S. Trivedi, Durham, NC (US);
Tilak C. Sharma, Tacoma, WA (US);
Dazhi Wang, San Jose, CA (US);
David William Twigg, Federal Way, WA (US);
Le P. Nguyen, Renton, WA (US);
Yun Liu, Lynwood, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A computer-based method for determining a probability that no path exists from a starting node to a target node within a network of nodes and directional links between pairs of nodes. The nodes and directional links form paths of a reliability graph and the method is performed using a computer coupled to a database. The method includes selecting a set of paths between the starting node and the target node that have been determined to be reliable, calculating a reliability of the union of the selected path sets, setting an upper bound for unreliability of the set of all paths, selecting a set of minimal cutsets from all cutsets that lie between the starting node and the target node, calculating the probability of the union of the minimal cutsets, and setting a lower bound for the unreliability of the set of all cutsets.