The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
May. 18, 2011
Liping Yan, Zhejiang, CN;
Benyong Chen, Zhejiang, CN;
Qiuhong Tian, Zhejiang, CN;
Zhengrong Sun, Zhejiang, CN;
Liping Yan, Zhejiang, CN;
Benyong Chen, Zhejiang, CN;
Qiuhong Tian, Zhejiang, CN;
Zhengrong Sun, Zhejiang, CN;
Zhejiang Sci-Tech University, Zhejiang, CN;
Abstract
Measuring refractive index of air based on laser synthetic wavelength interferometry. The Apparatus includes a dual-frequency laser that emits orthogonal linear polarized light of wavelengths λand λ, a beamsplitter, two polarizing beamsplitters, two corner-cube retroreflectors, a quartz vacuum cavity of length L disposed in the measuring optical path in parallel to the light propagation direction, and two detectors. The apparatus is used to measure the refractive index of air using the dual-frequency laser to emit orthogonal linear polarized light with wavelengths λand λ, using the beamsplitters, corner-cube retroreflectors, quartz vacuum cavity, and detectors. The integer N and fraction ε of interference fringes of wavelength λare determined. The refractive index of air n is obtained by using the length L of the vacuum cavity, integer N and fraction ε of the interference fringes of wavelength λ. The measurement is accurate up to 10or higher, and has strong anti-disturbance ability to the environment.