The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2014
Filed:
Jul. 23, 2009
Ronen Levy, Tel Aviv, IL;
Shlomo Ruschin, Tel Aviv, IL;
Ronen Levy, Tel Aviv, IL;
Shlomo Ruschin, Tel Aviv, IL;
Ramot at Tel Aviv University Ltd., Tel Aviv, IL;
Abstract
A sensor () and corresponding method for sensing variations in a parameter employ an optical device () defining two optical paths () differentially affected by a variation in the parameter so as to change the differential phase between the two paths. This differential phase is monitored by a spectral interrogation arrangement () including a radiation input device () for delivering to the optical device () incident radiation at a plurality of wavelengths, and a reading arrangement () for measuring the interference-modulated optical output. The optical device () is configured so that the two optical paths have differing dispersion properties such that a difference between the phase accumulated by light propagating along the optical paths as a function of wavelength exhibits a maximum or minimum at some wavelength designated λ. The plurality of wavelengths employed by the spectral interrogation arrangement span a range of wavelengths including, or adjacent to, λ.