The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

Nov. 20, 2012
Applicant:

Wistron Corporation, New Taipei, TW;

Inventors:

Lin-Husng Chang, New Taipei, TW;

Yu-Yen Chen, New Taipei, TW;

Po-Liang Huang, New Taipei, TW;

Kai-Chung Cheng, New Taipei, TW;

Assignee:

Wistron Corporation, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

A diagnostic system for an optical touch control module and an automatic diagnostic method thereof are disclosed. The diagnostic system is used for testing an optical capturing module of the optical touch control module. The diagnostic system includes a controlling module, a first test element, a second test element, and a rotary fixture. The first and the second test element are disposed on a touch surface for allowing the optical capturing module to capture a first and a second test signal. The rotary fixture is used for contacting to the optical capturing module, wherein the controlling module determines whether an image signal captured by the optical capturing module has the first and the second test signal. If not, the controlling module controls the rotary fixture to rotate the optical capturing module to adjust a capturing direction.


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