The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

May. 07, 2009
Applicants:

Chandrasekaran Venkatachalam, Fort Collins, CO (US);

Cuong M. Nguyen, Fort Collins, CO (US);

Dmitri N. Moisseev, Helsinki, FI;

Inventors:

Chandrasekaran Venkatachalam, Fort Collins, CO (US);

Cuong M. Nguyen, Fort Collins, CO (US);

Dmitri N. Moisseev, Helsinki, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/95 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the present invention provide for improved estimation of environmental parameters in a dual-polarization radar system. In some embodiments, environmental parameters can be estimated using a linear combination of data received in two orthogonal polarization states. In particular, embodiments of the invention improve ground clutter and noise mitigation in dual polarization radar systems. Moreover, embodiments of the invention also provide for systems to determine the differential reflectivity and/or the magnitude of the co-polar correlation coefficient and the differential phase in a dual polarization radar system.


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