The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

Jul. 21, 2010
Applicants:

Oleg N. Akimov, Niedersachsen, DE;

Ansgar Baule, Lower Saxony, DE;

Christian Fulda, Lower Saxony, DE;

Andreas Hartmann, Niedersachsen, DE;

Inventors:

Oleg N. Akimov, Niedersachsen, DE;

Ansgar Baule, Lower Saxony, DE;

Christian Fulda, Lower Saxony, DE;

Andreas Hartmann, Niedersachsen, DE;

Assignee:

Baker Hughes Incorporated, Houston, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); E21B 45/00 (2006.01); E21B 47/12 (2012.01); E21B 47/00 (2012.01);
U.S. Cl.
CPC ...
E21B 47/12 (2013.01); E21B 47/00 (2013.01);
Abstract

In one aspect, a method for assessing quality of a downhole data is provided. The method, according to one embodiment, may include defining a quality criterion based on one or more parameters of interest, determining a quality assessment value for a first data, determining a quality assessment value for each run of a plurality of runs using the quality criterion, determining a quality factor from the computed quality assessment values of the plurality of runs, and determining a quality level of the first data using the quality assessment value of the first data and the quality factor of the computed quality assessment values.


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