The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

Jan. 04, 2011
Applicants:

Qingguo Xie, Wuhan, CN;

Jingjing Liu, Wuhan, CN;

Inventors:

Qingguo Xie, Wuhan, CN;

Jingjing Liu, Wuhan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/166 (2006.01); G12B 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A positron emission tomography method and a device with application adaptability. The method includes: step 1, scanning a tested object for obtaining initial activity information of the tested object; step 2, programming and adjusting a detector module based on the result of the initial scan to obtain a new system structure, and rapidly calibrating the new system structure; step 3, performing a scan with the new system structure for obtaining activity information of the tested object; step 4, analyzing the activity information of the tested object obtained at step 3. If quality of the activity information can satisfy requirements of the application, the scan is finished; otherwise programming and adjusting the detector module is repeated, rapid calibration is performed, and the activity information of the tested object is obtained again with the new system structure until the activity information satisfies requirements.


Find Patent Forward Citations

Xie, Qingguo. (2014). Positron emission tomography method and device with application adaptability (U.S. Patent No. 8664611). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8664611

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…