The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

Mar. 28, 2008
Applicants:

Masaharu Shibata, Kobe, JP;

Noriyoshi Yoshida, Kobe, JP;

Inventors:

Masaharu Shibata, Kobe, JP;

Noriyoshi Yoshida, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sample analyzer that includes a sample preparing section operative to aspirate a sample from a sample container and a measuring section operative to prepare a plurality of measurement samples from the aspirated sample. A control unit is configured to sequentially measure the plurality of prepared measurement samples, obtain a plurality of measurement data for the respective measurement samples, and obtain an analysis result of a predetermined item of the sample based on the plurality of measurement data.


Find Patent Forward Citations

Loading…