The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

Oct. 16, 2009
Applicants:

Akiko Katoh, Hamura, JP;

Tohru Yanagisawa, Kodaira, JP;

Inventors:

Akiko Katoh, Hamura, JP;

Tohru Yanagisawa, Kodaira, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 19/56 (2012.01); H03H 9/215 (2006.01); H03H 9/21 (2006.01); H03H 9/02 (2006.01); H03H 3/02 (2006.01); G01C 19/5628 (2012.01);
U.S. Cl.
CPC ...
H03H 9/215 (2013.01); H03H 9/21 (2013.01); H03H 9/02023 (2013.01); H03H 9/02118 (2013.01); H03H 2003/026 (2013.01); G01C 19/5628 (2013.01);
Abstract

The invention is directed to the provision of a method for manufacturing a crystal oscillator manufacturing method that can achieve a highly precise fine adjustment without applying unnecessary external force to a crystal oscillator, and that can adjust a plurality of crystal oscillators in a collective manner. More specifically, the invention provides a method for manufacturing a crystal oscillator includes a first etching step for forming a prescribed external shape, an electrode forming step for forming an electrode at least in a portion of a surface of the external shape, a leakage amount measuring step for measuring leakage amount associated with leakage vibration of the external shape, and a second etching step for etching the external shape by an amount that is determined based on a measurement result of the leakage amount measuring step so as to adjust balance.


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