The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

Mar. 30, 2006
Applicant:

Mark A. Stanish, Seattle, WA (US);

Inventor:

Mark A. Stanish, Seattle, WA (US);

Assignee:

Weyerhaeuser NR Company, Federal Way, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23Q 15/00 (2006.01); B23Q 16/00 (2006.01); B27B 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods for reducing warp potential of lumber derived from a raw material, such as a log or stem are provided. The methods involve examining the log or stem for shrinkage properties and/or properties of spiral grain. The location of the shrinkage properties and/or properties of spiral grain determine how the log is oriented relative to a cutting device. In another embodiment, these characteristics determine what cutting pattern is selected for creating the lumber. In the case of a stem, these characteristics determine how the stem will be bucked.


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