The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2014

Filed:

Jun. 01, 2011
Applicants:

Afshin S. Daryoush, Bryn Mawr, PA (US);

Peter A. Lewin, Wyndmoor, NJ (US);

Rupa Gopinath Minasamudram, Bangalore, IN;

Mahmoud A. El-sherif, Narberth, PA (US);

Inventors:

Afshin S. Daryoush, Bryn Mawr, PA (US);

Peter A. Lewin, Wyndmoor, NJ (US);

Rupa Gopinath Minasamudram, Bangalore, IN;

Mahmoud A. El-Sherif, Narberth, PA (US);

Assignee:

Drexel University, Philadelphia, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 11/00 (2006.01); G02B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is detecting changes in pressure in a medium, with an optical fiber having a core diameter at an immersion surface contact of the fiber of less than 10 μm; a layer of material deposited on said end of the fiber, the material being of a thickness of from about 2 nm to about 10 nm. Also disclosed is detecting pressure waves in a medium comprising: contacting the medium with a fiber optic, the fiber integrated with a light source and a detector, the fiber optic having a diameter of less than 10 μm at an immersion surface contact of the fiber; providing a thin layer of material on the immersion surface contact, wherein said thin layer of material is of a thickness in a range of from about 2 nm to about 10 nm; and detecting Fresnel back reflections from the immersion end of the fiber.


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