The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2014

Filed:

May. 09, 2012
Applicants:

Shlomi Cohen-ganor, Beit Zayit, IL;

Wesley Kenneth Wilhelm, Spokane, WA (US);

Pinchas Ben-or, Issaquah, WA (US);

Inventors:

Shlomi Cohen-Ganor, Beit Zayit, IL;

Wesley Kenneth Wilhelm, Spokane, WA (US);

Pinchas Ben-Or, Issaquah, WA (US);

Assignee:

Nice-Systems Ltd., Ra'anana, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1416 (2013.01); H04L 63/1408 (2013.01);
Abstract

A system and method for determining a risk root cause are provided. A first and second fraud related risk scores respectively associated with a first and second nodes may be determined. A relation strength value related to at least one relation between the first and second nodes may be determined. A relation strength value and a first and second node risk scores may be used to calculate a cluster risk score for a cluster including the first and second nodes. Other embodiments are described and claimed.


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