The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 25, 2014

Filed:

Jun. 27, 2011
Applicants:

Joseph Macri, Sunnyvale, CA (US);

Stephen Morein, Sunnyvale, CA (US);

Claude Gauthier, Sunnyvale, CA (US);

Ming-ju E. Lee, Sunnyvale, CA (US);

Lin Chen, Sunnyvale, CA (US);

Inventors:

Joseph Macri, Sunnyvale, CA (US);

Stephen Morein, Sunnyvale, CA (US);

Claude Gauthier, Sunnyvale, CA (US);

Ming-Ju E. Lee, Sunnyvale, CA (US);

Lin Chen, Sunnyvale, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for detecting errors in high-speed asymmetric interfaces are described. Embodiments include transmitting digital data between a first system component and a second system component over a bidirectional interface, wherein the first component is significantly more intelligent than the second component. The first component controls many operations of the second component, including receiving a signature from the second component over an existing line of the interface. The signature received is compared to a signature stored by the first component. Both signatures correspond to a transaction over the interface. Based on the comparison, the first component determines whether the transaction was successful, and directs the second component as necessary.


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