The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2014
Filed:
Jun. 30, 2011
Francis E. Del Rosario, Rochester, MN (US);
Jie LI, Shenzhen, CN;
Antoine G. Sater, Rochester, MN (US);
Hong YE, Shenzhen, CN;
Francis E. del Rosario, Rochester, MN (US);
Jie Li, Shenzhen, CN;
Antoine G. Sater, Rochester, MN (US);
Hong Ye, Shenzhen, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, data processing system, and computer program product for testing a computer system. A sequencer tests the computer system using test modules arranged in a first sequence, wherein each of the test modules is for testing at least a portion of the computer system. The sequencer determines if an operator is available, in response to an interrupt generated by a test module. If an operator is available, the sequencer arranges the test modules into a second sequence based on a first policy. If an operator is unavailable, the sequencer arranges the test modules into a third sequence based on a second policy.