The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2014
Filed:
May. 04, 2009
Al-homci Maan, Hamburg, DE;
Klemens Brumm, Wedel, DE;
Jan Bobolecki, Borstel-Hohenraden, DE;
Rainer Casdorff, Hamburg, DE;
Josef Kruse, Hamburg, DE;
Dirk Martinen, Jork, DE;
Al-Homci Maan, Hamburg, DE;
Klemens Brumm, Wedel, DE;
Jan Bobolecki, Borstel-Hohenraden, DE;
Rainer Casdorff, Hamburg, DE;
Josef Kruse, Hamburg, DE;
Dirk Martinen, Jork, DE;
Airbus Deutschland GmbH, Hamburg, DE;
Abstract
The invention relates to a method for configuring a test arrangement for a device to be tested, which is one component of a system containing, several components. The components of the system are described by data records, which have elements that describe relationships of components with one another. The method includes linking the data records to generate a system description based on the linked data records, simulating of the system by a simulation based on the system description, wherein an image of the device to be tested is in the simulation. The method also includes removal of the image of the device from the simulation and provision of one or more test interfaces in hardware for communication between the simulation facility and the device.