Scalable high speed gigabit active bundle link and tester

Abstract

A scalable signal processing test device and related signal processing techniques are provided herein for processing signals at a signal processing module of the scalable signal processing test device. Source electrical signals are processed to generate test electrical signals that model electrical signals produced by an optical module from received optical signals in accordance with a high speed optical standard for optical transmission. The test electrical signals are transmitted over transmit links to a host device that is configured to receive the test electrical signals in a format that would normally be produced by an optical module in accordance with the high speed optical standard. The test electrical signals are received after they have been looped back from the host device over receive links from the host device. The host device is a device that is configured to output the test electrical signals in a format suitable for processing by an optical module in accordance with the high speed optical standard. The test electrical signals received from the host device are analyzed in order to determine whether the host device outputs the one or more sets of test electrical signals in compliance with the high speed optical standard.