The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2014
Filed:
Mar. 22, 2011
Yunqian MA, Plymouth, MN (US);
Benjamin Mohr, St. Louis Park, MN (US);
Yunqian Ma, Plymouth, MN (US);
Benjamin Mohr, St. Louis Park, MN (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
A method for wide baseline feature matching comprises capturing one or more images from an image sensor on each of two or more platforms when the image sensors have overlapping fields of view, performing a 2-D feature extraction on each of the captured images in each platform using local 2-D image feature descriptors, and calculating 3-D feature locations on the ellipsoid of the Earth surface from the extracted features using a position and attitude of the platform and a model of the image sensor. The 3-D feature locations are updated using digital terrain elevation data (DTED) as a constraint, and the extracted features are matched using the updated 3-D feature locations to create a common feature zone. A subset of features from the common feature zone is selected, and the subset of features is inputted into a collaborative filter in each platform. A convergence test is then performed on other subsets in the common feature zone, and falsely matched features are pruned from the common feature zone.